A polishing pad used in a final polishing process, which is excellent in polishing speed and polishing accuracy and which is different from conventional suede-type polishing pads, is provided. [Solution] The present invention is The present invention relates to a polishing pad for glass or semiconductor wafers, in which a polishing layer having a polishing surface is bonded to a substrate supporting the polishing layer. In the present invention, the polishing layer of the polishing pad is made of split fiber fabric composed of two kinds of polymers, a first polymer made of polyester or the like and a second polymer made of polyamide, polyolefin or the like. The split yarn is particularly preferably one in which the layered first polymer and the layered second polymer are alternately laminated in the cross-sectional structure. [Selection drawing] Fig. 2【課題】仕上げ研磨工程で使用される研磨パッドであって、研磨速度及び研磨精度に優れ、これまでのスエードタイプの研磨パッドと異なる新たな研摩パッドを提供する。【解決手段】本考案は、研磨面を有する研磨層が前記研磨層を支持する基材に接合されてなるガラス用又は半導体ウエハ用の研磨パッドに関する。本考案では、ポリエステル等からなる第1ポリマーとポリアミドやポリオレフィン等からなる第2ポリマーの2種のポリマーにより構成される割繊糸の織物を研磨パッドの研磨層とする。割繊糸は、特に、断面構造において層状の第1ポリマー及び第2ポリマーが交互に積層しているものが好ましい。【選択図】図2